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 FCA35N60 N-Channel MOSFET
March 2009
FCA35N60
600V N-Channel MOSFET
Features
* 650V @ TJ = 150C * Typ.RDS(on) = 0.079 * Ultra low gate charge ( Typ. Qg = 139nC ) * Low effective output capacitance ( Typ. Coss.eff = 340pF ) * 100% avalanche tested
SuperFETTM
Description
SuperFETTM is Farichild's proprietary, new generation of high voltage MOSFET family that is utilizing an advanced charge balance mechanism for outstanding low on-resistance and lower gate charge performance. This advanced technology has been tailored to minimize conduction loss, provide superior switching performance, and withstand extreme dv/dt rate and higher avalanche energy. Consequently, SuperFET is very suitable for various AC/DC power conversion in switching mode operation for system miniaturization and higher efficiency.
D
G
TO-3PN
G DS S
o
MOSFET Maximum Ratings TC = 25 C unless otherwise noted*
Symbol VDSS VGSS ID IDM EAS IAR EAR dv/dt PD TJ, TSTG TL Parameter Drain to Source Voltage Gate-Soure voltage Drain Current Drain Current Single Pulsed Avalanche Energy Avalanche Current Repetitive Avalanche Energy Peak Diode Recovery dv/dt Power Dissipation - Derate above 25oC (TC = 25oC) -Continuous (TC = 25oC) - Pulsed -Continuous (TC = 100oC) (Note 1) (Note 2) (Note 1) (Note 1) (Note 3) Ratings 600 30 35 22.2 105 1455 35 31.25 20 312.5 2.5 -55 to +150 300 Units V V A A mJ A mJ V/ns W W/oC
o o
Operating and Storage Temperature Range Maximum Lead Temperature for Soldering Purpose, 1/8" from Case for 5 Seconds
C C
*Drain current limited by maximum junction temperature
Thermal Characteristics
Symbol RJC RCS RJA Parameter Thermal Resistance, Junction to Case Thermal Resistance, Case-to-Heat Sink Thermal Resistance, Junction to Ambient Typ. 0.24 Max. 0.4 42
o
Units C/W
(c)2009 Fairchild Semiconductor Corporation FCA35N60 Rev. A
1
www.fairchildsemi.com
FCA35N60 N-Channel MOSFET
Package Marking and Ordering Information TC = 25oC unless otherwise noted
Device Marking FCA35N60 Device FCA35N60 Package TO-3PN Reel Size Tape Width Quantity 30
Electrical Characteristics
Symbol Parameter Test Conditions Min. Typ. Max. Units
Off Characteristics
BVDSS BVDSS / TJ BVDS IDSS IGSS Drain to Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Drain-Source Avalanche Breakdown Voltage Zero Gate Voltage Drain Current Gate to Body Leakage Current ID = 250A, VGS = 0V, TJ = 25oC ID = 250A, Referenced to 25oC VGS = 0V, ID = 16A VDS = 480V, TC = 125oC VGS = 30V, VDS = 0V VDS = 600V, VGS = 0V 600 650 0.6 700 1 10 100 V V V/oC V A nA ID = 250A, VGS = 0V, TJ = 150oC
On Characteristics
VGS(th) RDS(on) gFS Gate Threshold Voltage Static Drain to Source On Resistance Forward Transconductance VGS = VDS, ID = 250A VGS = 10V, ID = 17.5A VDS = 40V, ID = 17.5A 3.0 0.079 28.8 5.0 0.098 V S
Dynamic Characteristics
Ciss Coss Crss Coss Coss eff. Qg Qgs Qgd ESR Input Capacitance Output Capacitance Reverse Transfer Capacitance Output Capacitance Effective Output Capacitance Total Gate Charge at 10V Gate to Source Gate Charge Gate to Drain "Miller" Charge Equivalent Series Resistance (G-S) VDS = 480V, ID = 35A VGS = 10V Drain Open, F= 1MHZ VDS = 25V, VGS = 0V f = 1MHz VDS = 480V, VGS = 0V, f = 1.0MHz VDS = 0V to 480V, VGS = 0V (Note 4)
4990 2380 140 113 340 139 31 69 1.4
6640 3170 181 -
pF pF pF pF pF nC nC nC
-
Switching Characteristics
td(on) tr td(off) tf Turn-On Delay Time Turn-On Rise Time Turn-Off Delay Time Turn-Off Fall Time VDD = 300V, ID = 35A RG = 4.7
(Note 4)
-
34 120 105 73
78 250 220 155
ns ns ns ns
Drain-Source Diode Characteristics
IS ISM VSD trr Qrr Maximum Continuous Drain to Source Diode Forward Current Maximum Pulsed Drain to Source Diode Forward Current Drain to Source Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge VGS = 0V, ISD = 35A VGS = 0V, ISD = 35A dIF/dt = 100A/s 614 16.3 35 105 1.4 A A V ns C
Notes: 1: Repetitive Rating: Pulse width limited by maximum junction temperature 2: IAS = 17.5A, VDD = 50V, RG = 25, Starting TJ = 25C 3: ISD 35A, di/dt 200A/s, VDD BVDSS, Starting TJ = 25C 4: Essentially Independent of Operating Temperature Typical Characteristics
FCA35N60 Rev. A
2
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FCA35N60 N-Channel MOSFET
Typical Performance Characteristics
Figure 1. On-Region Characteristics
200 100
VGS = 15.0 V 10.0 V 8.0 V 7.0 V 6.5 V 6.0 V 5.5 V
Figure 2. Transfer Characteristics
200 100
ID, Drain Current[A]
ID, Drain Current[A]
10
10
150 C
o
-55 C 25 C
o
o
1 0.3 0.1
*Notes: 1. 250s Pulse Test 2. TC = 25 C
o
1 VDS, Drain-Source Voltage[V]
10
20
1
*Notes: 1. VDS = 20V 2. 250s Pulse Test
4
5 6 7 8 VGS, Gate-Source Voltage[V]
9
Figure 3. On-Resistance Variation vs. Drain Current and Gate Voltage
0.24
Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperature
500
RDS(ON) [], Drain-Source On-Resistance
IS, Reverse Drain Current [A]
0.20
100
0.16
0.12
VGS = 10V VGS = 20V
150 C
o
10
25 C
o
0.08
0.04
*Note: TC = 25 C
o
*Notes: 1. VGS = 0V
0
25
50 75 ID, Drain Current [A]
100
125
1 0.2
2. 250s Pulse Test
0.4 0.8 1.2 VSD, Body Diode Forward Voltage [V]
1.6
Figure 5. Capacitance Characteristics
50000
Figure 6. Gate Charge Characteristics
10
VGS, Gate-Source Voltage [V]
VDS = 100V VDS = 250V VDS = 400V
10000
Capacitances [pF]
Ciss
8
6
1000
*Note: 1. VGS = 0V 2. f = 1MHz
Ciss = Cgs + Cgd (Cds = shorted) Coss = Cds + Cgd Crss = Cgd
Coss
4
100
2
*Note: ID = 35A
10 0.1
Crss
0
1 10 100 VDS, Drain-Source Voltage [V]
600
0
40 80 120 Qg, Total Gate Charge [nC]
160
FCA35N60 Rev. A
3
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FCA35N60 N-Channel MOSFET
Typical Performance Characteristics (Continued)
Figure 7. Breakdown Voltage Variation vs. Temperature
1.15 BVDSS, [Normalized] Drain-Source Breakdown Voltage
RDS(on), [Normalized] Drain-Source On-Resistance
Figure 8. On-Resistance Variation vs. Temperature
3.0 2.5 2.0 1.5 1.0 0.5 0.0 -100
*Notes: 1. VGS = 10V 2. ID = 17.5A
1.10 1.05 1.00 0.95 0.90 0.85 -100
*Notes: 1. VGS = 0V 2. ID = 250A
-50 0 50 100 150 o TJ, Junction Temperature [ C]
200
-50 0 50 100 150 o TJ, Junction Temperature [ C]
200
Figure 9. Maximum Safe Operating Area
300 100
100s 10s
Figure 10. Maximum Drain Current vs. Case Temperature
40
ID, Drain Current [A]
1ms
10
DC
10ms
1
Operation in This Area is Limited by R DS(on)
ID, Drain Current [A]
1000
30
20
0.1
*Notes: 1. TC = 25 C 2. TJ = 150 C 3. Single Pulse
o o
10
0.01
1
10 100 VDS, Drain-Source Voltage [V]
0 25
50 75 100 125 o TC, Case Temperature [ C]
150
Figure 11. Transient Thermal Response Curve
0.6
Thermal Response [ZJC]
0.5
0.1
0.2 0.1 0.05
PDM t1 t2
o
0.01
0.02 0.01 Single pulse
*Notes: 1. ZJC(t) = 0.4 C/W Max. 2. Duty Factor, D= t1/t2 3. TJM - TC = PDM * ZJC(t)
0.001 -5 10
10
-4
10 10 10 Rectangular Pulse Duration [sec]
-3
-2
-1
1
10
FCA35N60 Rev. A
4
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FCA35N60 N-Channel MOSFET
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & Waveforms
FCA35N60 Rev. A
5
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FCA35N60 N-Channel MOSFET
Peak Diode Recovery dv/dt Test Circuit & Waveforms
FCA35N60 Rev. A
6
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FCA35N60 N-Channel MOSFET
Mechanical Dimensions
TO-3PN
FCA35N60 Rev. A
7
www.fairchildsemi.com
FCA35N60 N-Channel MOSFET
TRADEMARKS The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not intended to be an exhaustive list of all such trademarks. Build it NowTM CorePLUSTM CorePOWERTM CROSSVOLTTM CTLTM Current Transfer LogicTM EcoSPARK(R) EfficentMaxTM EZSWITCHTM *
TM
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Fairchild(R) Fairchild Semiconductor(R) FACT Quiet SeriesTM FACT(R) FAST(R) FastvCoreTM FlashWriter(R) * FPSTM F-PFSTM
FRFET(R) Global Power ResourceSM Green FPSTM Green FPSTM e-SeriesTM GTOTM IntelliMAXTM ISOPLANARTM MegaBuckTM MICROCOUPLERTM MicroFETTM MicroPakTM MillerDriveTM MotionMaxTM Motion-SPMTM OPTOLOGIC(R) OPTOPLANAR(R)
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Programmable Active DroopTM QFET(R) QSTM Quiet SeriesTM RapidConfigureTM Saving our world, 1mW /W /kW at a timeTM SmartMaxTM SMART STARTTM SPM(R) STEALTHTM SuperFETTM SuperSOTTM-3 SuperSOTTM-6 SuperSOTTM-8 SupreMOSTM SyncFETTM (R) The Power Franchise(R)
TM
TinyBoostTM TinyBuckTM TinyLogic(R) TINYOPTOTM TinyPowerTM TinyPWMTM TinyWireTM TriFault DetectTM SerDesTM
PDP SPMTM Power-SPMTM PowerTrench(R) PowerXSTM
UHC(R) Ultra FRFETTM UniFETTM VCXTM VisualMaxTM XSTM
* EZSWITCHTM and FlashWriter(R) are trademarks of System General Corporation, used under license by Fairchild Semiconductor. DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD'S WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury of the user. 2. A critical component in any component of a life support, device, or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness.
ANTI-COUNTERFEITING POLICY Fairchild Semiconductor Corporation's Anti-Counterfeiting Policy. Fairchild's Anti-Counterfeiting Policy is also stated on our external website, www.Fairchildsemi.com, under Sales Support. Counterfeiting of semiconductor parts is a growing problem in the industry. All manufactures of semiconductor products are experiencing counterfeiting of their parts. Customers who inadvertently purchase counterfeit parts experience many problems such as loss of brand reputation, substandard performance, failed application, and increased cost of production and manufacturing delays. Fairchild is taking strong measures to protect ourselves and our customers from the proliferation of counterfeit parts. Fairchild strongly encourages customers to purchase Fairchild parts either directly from Fairchild or from Authorized Fairchild Distributors who are listed by country on our web page cited above. Products customers buy either from fairchild directly or from Authorized Fairchild Distributors are genuine parts, have full traceability, meet Fairchild's quality standards for handing and storage and provide access to Fairchild's full range of up-to-date technical and product information. Fairchild and our Authorized Distributors will stand behind all warranties and will appropriately address and warranty issues that may arise. Fairchild will not provide any warranty coverage or other assistance for parts bought from Unauthorized Sources. Fairchild is committed to combat this global problem and encourage our customers to do their part in stopping this practice by buying direct or from authorized distributors. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Advance Information Preliminary No Identification Needed Obsolete Product Status Formative / In Design First Production Full Production Not In Production Definition Datasheet contains the design specifications for product development. Specifications may change in any manner without notice. Datasheet contains preliminary data; supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve design. Datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice to improve the design. Datasheet contains specifications on a product that is discontinued by Fairchild Semiconductor. The datasheet is for reference information only.
Rev. I38
FCA35N60 Rev. A
8
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